Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...
Scientists at the Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new way to determine atomic structures from nanocrystals previously considered unusable, ...
Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...
What is Atom Probe Tomography? Atom Probe Tomography (APT) is a powerful analytical technique that provides three-dimensional (3D) imaging and chemical composition analysis of materials at the atomic ...
Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the three-dimensional positions and elemental identities of atoms in amorphous materials.
A new technical paper, “3D atomic-scale metrology of strain relaxation and roughness in Gate-All-Around transistors via electron ptychography,” was published by researchers at Cornell University, ASM ...
They applied the 2017 Nobel Prize-winning 3D structural analysis method for protein particles to solve a long-standing challenge. (Nanowerk News) Seoul National University College of Engineering ...
The X-ray Laboratory of Rigaku Corporation, a Rigaku Holdings Group company and a global solution partner for X-ray analysis (headquarters: Akishima, Tokyo; president and CEO: Jun Kawakami; “Rigaku”), ...
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