As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...
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