Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...
The very process of testing digital circuits routinely increases their dynamic power consumption to levels far exceeding their power specification. If the power consumption is great enough, it can ...