Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

The modernization of programming languages and the importance of better coding techniques is directly related to the evolution from mechanical computers to modern software-development processes. We ...

(Nanowerk News) Like any material, atomically thin, 2D semiconductors known as TMDs or transition metal dichalcogenides are not perfect, but their imperfections can actually be a good thing.

Researchers in the United States have developed a way to detect hidden defects in ultra-thin electronic materials that can cause devices to fail at lower voltages.

Uranium dioxide, the principal nuclear fuel in many reactors, exhibits complex defect chemistry that directly influences its electronic structure and overall performance. The presence of point defects ...

Defect Engineering Strategies for Enhancing LDH-Based OER Catalysts. This schematic summarizes the key electronic defect engineering approaches used to boost the oxygen evolution reaction (OER) ...

Researchers in the lab of UChicago Pritzker School of Molecular Engineering Prof. David Awschalom, including postdoctoral scholar Jonathan Marcks (right) and graduate student Benjamin S. Soloway, have ...