Semiconductor manufacturers rely on latch-up tests to characterize ICs for susceptibility to electrical failure. Engineers can use various methods to perform latch-up tests, but the only standard that ...
NORWOOD, Mass.--(BUSINESS WIRE)--Analog Devices, Inc. (ADI), a global leader in high-performance semiconductors for signal-processing applications, today introduced new switches able to guarantee ...
2.5D/3D ICs have evolved into an innovative solution for many design and integration situations, but they present unique verification obstacles that challenge electronic design automation (EDA) tools ...
Santa Clara, Calif. – Dual junction field-effect transistors (JFETs) from Siliconix Inc. are said to eliminate latch-up problems in amplifier designs. Latch-up occurs when several JFETs on the same ...
In the semiconductor industry, the use of radiation-hardened power MOS devices to avoid latchup is less common than hardening logic and memories to avoid single-event upsets. Going the less-traveled ...
2.5D/3D integrated circuits (ICs) have evolved into an innovative solution for many IC design and integration challenges. As shown in figure 1, 2.5D ICs have multiple dies placed side-by-side on a ...
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