Business Wire

JEM America Introduces New Probe Card for Advanced Packaging; Crown Shaped Probe Tips Offer Highly Reliable Contact, No Damage to the Bump, Minimal Probe Tip Wear and Minimal ...

FREMONT, Calif.--(BUSINESS WIRE)--Nov. 9, 2005--JEM America, a subsidiary of Japan Electronic Materials Corporation (JEM), has introduced a new series of probe cards aimed at the advanced packaging ...
EDN

Probe card is designed for wafer-level packages

Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...
Electronic Design

Improving the Structural Stability Of Probe Cards

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Electronic Design

IC ATE – Improving the Structural Stability Of Probe Cards

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...