With the scanning electron microscope (SEM), scientists in a range of fields—from biology to materials science to microelectronics—can analyze the surface of objects with a resolution approaching ...

-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...

Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...

Indian American researcher’s new AI-enhanced scanning method promises to boost quest for high-resolution mapping of the brain ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

Coatings are required to remove or diminish the electrical charges that promptly accumulate in a nonconducting material when examined by a high-energy electron beam. Material samples investigated at ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

Electron microscopy allows researchers to visualize the morphological effects of biological, genetic, and physical perturbations by diving into tissues and cells. Images collected on our microscopes ...

A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...

The Thermo Fisher Apreo 2 Variable Pressure Field Emission Scanning Electron Microscope (FE-SEM) is a thermionic field emission high-resolution scanning electron microscope. The Apreo 2 FE-SEM is an ...