Semiconductor Engineering

Wafer Bin Map Defect Classification Using Semi-Supervised Learning

A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...
EurekAlert!

A review on multi-view learning

Review re-maps multi-view learning into four supervised scenarios and three granular sub-tiers, delivering the first unified blueprint for researchers to navigate classification, clustering, ...
Scientific Research Publishing

Boosting Algorithm: An Ensemble Learning Tool for Land Use Land Cover Classification Using Google Alpha Earth Foundations Satellite Embeddings ()

An Ensemble Learning Tool for Land Use Land Cover Classification Using Google Alpha Earth Foundations Satellite Embeddings ...
Computer Weekly

Data classification tools: What they do and who makes them

Data classification is an essential pre-requisite to data protection, security and compliance. Firms need to know where their data is and the types of data they hold. Organisations also need to ...