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Image data fusion of SIMS and TOF-SIMS with a high spatial resolution is helpful to obtain a clearer score image by PCA. An image data fusion of SIMS and TOF-SMS in high spatial and mass resolution ...
ION TOF. TOF-SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This equipment is engineered for the ...
David J Scurr and Matthew Piggott describe how time-of-flight secondary ion mass spectrometry is helping scientists in a variety of industries to understand problems related to materials science ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
Editor’s note: An open house is planned at the University of Delaware’s Surface Analysis Facility, located in Lammot du Pont Laboratory on UD’s Newark campus Friday, Sept. 23, from noon to 2 p.m. The ...
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