Semiconductor Probe / Probe Needle / Probe Pin # Used for CP (Chip Probing) / Wafer Sort • Before wafer dicing, each die undergoes: • Open/short circuit testing • Voltage/current testing • Power consumption, leakage current, and functional parameter testing
0:36
Semiconductor Probe / Probe Needle / Probe Pin # Used for CP (Chip Probing) / Wafer Sort • Before wafer dicing, each die undergoes: • Open/short circuit testing • Voltage/current testing • Power consumption, leakage current, and functional parameter testing
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